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Dahoo, Pierre-Richard | El Hami, Abdelkhalak | Pougnet, Philippe

Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties

2021 - ISTE

256 p.

provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master�s students. [Publisher's Text]

288699 characters.